where expertise comes together - since 1996 -

The Largest Open Access Portal of Nondestructive Testing (NDT)

Conference Proceedings, Articles, News, Exhibition, Forum, Network and more

where expertise comes together
- since 1996 -
Beta-Version of this Page View
NDT.net Issue - 2008-11 - NEWS
NDT.net Issue: 2008-11
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)
NEWS

Active Pixel CMOS Flat Panel Array from Hamamatsu

Hamamatsu Photonics32, Hamamatsu-city, Japan

Hamamatsu Photonics introduce the C9728DK-10, an x-ray sensitive, “active pixel CMOS” image sensor. Each separate pixel in the Megapixel (1056x1056) image format has an individual amplifier, providing extremely low noise readout. The noise is at least six times lower than existing conventional passive type CMOS flat panel sensors from Hamamatsu.

Utilising a CDS (Correlated Double Sampling) circuit and a direct deposition (DD) columnar structure CsI scintillator, the C9728DK-10 can create high quality true 14-bit digital video signals. The specific DD CsI scintillator construction eliminates the need for focusing lenses or tapered fibre-optics associated with use of CCD sensors, which can cause image distortion and / or peeling problems in the field.

This very low noise sensor is therefore suitable for x-ray diffraction pattern imaging and other scientific x-ray imaging requiring very low noise. Hamamatsu also supplies a range of sealed and open type micro-focus x-ray sources for high resolution x-ray imaging applications.

For further information, contact us on freephone: 00 800 800 800 88 Email: Europe@hamamatsu.com or visit our website: www.sales.hamamatsu.com

Keywords: Radiographic Testing (RT) (1523), flat-panel detector (38), CMOS Flat Panel Array (1),
*Keywords are freely formed keywords from the authors and thus you may Search also for similar terms.  


Feedback: ()

Share:
More from "Hamamatsu Photonics" (5 of 33)
2017-04Hamamatsu Photonics Announces Completion of a New Building to Increase Production Capacity of Opto-Semiconductors and x-ray non-destructive inspection systems
2017-02Hamamatsu adds uncooled high-speed and high-sensitivity InAsSb device (3 to 11 μm) to infrared detector line-up
2016-08Hamamatsu Photonics UK Announces Technology Specialist in India
2016-04Hamamatsu New LED for CO² Measurement
2016-04Hamamatsu New MEMS FPI Sensor
... All 33 Details >
Share...
We use technical and analytics cookies to ensure that we will give you the best experience of our website - More Info
Accept
top
this is debug window