where expertise comes together - since 1996 -

The Largest Open Access Portal of Nondestructive Testing (NDT)

Conference Proceedings, Articles, News, Exhibition, Forum, Network and more

where expertise comes together
- since 1996 -
Beta-Version of this Page View
NDT.net Issue - 2009-03 - NEWS
NDT.net Issue: 2009-03
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)
NEWS

New camera vendor delivers more efficient fault detection for fast inline solar cell inspection.

Andor12, Belfast, Ireland

Andor Technology enters solar energy market with high performance NIR-enhanced CCD and EMCCD cameras to leverage photovoltaic luminescence imaging.

Munich, Germany, 4 March 2009 - Andor Technology plc (Andor), a world leader in scientific imaging and spectroscopy solutions, announces its entrance into the solar research and production inline cell inspection market at the 4th Photovoltaic Technology Show Europe 2009 in Munich.

Common faults in solar cells and panels are a known fact in the industry, and so far technology answers have been unsatisfactory. Andor promises to help researchers and industrial partners to detect such costly faults far more simply, in using its high-performance cameras the iKon-M 934 BR-DD and the LucaEM R.

The LucaEM R is a highly cost-effective yet fast and powerful Electron Multiplying CCD (EMCCD) camera for high throughput in-line production inspection. LucaEM R uses a very low noise megapixel frame-transfer EMCCD sensor, providing single photon detection sensitivity and high NIR quantum efficiency (27% QE @ 900 nm) in an air cooled, compact, USB 2.0 camera platform.

This camera also offer exceptionally high sensitivity at rapid frame rates, meaning that they can be used for high-throughput testing of individual photovoltaic cells running 24/7 at 1 cell/sec and faster.

The iKon-M 934 BR-DD is designed to offer ultimate responsivity in the NIR region, delivering ~70% QE at 900nm. The megapixel CCD camera also benefits from deep TE cooling to -100ºC, very low read noise and a convenient USB 2.0 interface, making it the perfect tool for luminescence imaging research of PV cells.

By incorporating photovoltaic electroluminescence into their QC routines and R&D work, manufacturers can benefit from a simpler, potentially less expensive inspection technique. However, as photovoltaic electroluminescence emissions are very weak, extremely sensitive cameras are required, such as the iKon-M BR-DD and the LucaEM R.

Andor s Application Specialist and Sales Engineer will explain how solar energy professionals and researchers can benefit from the two advanced cameras LucaEM R and iKon-M 934 BR-DD on stand C13 in Hall C2 (LOT) at the International Congress Centre in Munich on 4-6 March 2009.

 
Feedback: ()

Share:
More from "Andor" (5 of 11)
2014-03Andor Technology joins Oxford Instruments to drive growth
2010-06Highly-sensitive EMCCD camera helps redraw the boundaries of super-resolution 3D imaging
2010-02Andor Technology Pushes Interline CCD Performance Even Further ...
2009-11First direct measurements of trace pollutants in fresh vegetables using laser plasma spectroscopy
2009-02New Spectrograph with Imaging Capability launched at Photonics West
... All 11 Details >
Share...
We use technical and analytics cookies to ensure that we will give you the best experience of our website - More Info
Accept
top
this is debug window