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NDT.net Issue - 2009-12 - NEWS
NDT.net Issue: 2009-12
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)

SIUI attends ASNT and APCNDT 2009

SIUI (Shantou Institute of Ultrasonic Instruments Co.,Ltd.)12, Shantou, China

Recently SIUI exhibited in two NDT events: ASNT Fall Conference and Quality Testing Show 2009 (October 19-21 in the USA); and the 13th Asia-Pacific Conference on Non- Destructive Testing (APCNDT 2009, November 9-12 in Japan). In these two shows, which exert significant influence upon NDT industry, exhibitors showcased their latest products and NDT techniques, exchanged and shared advanced knowledge in nondestructive testing with visitors.

The debut of phased-array ultrasonic flaw detector CTS-602 attracted great attention in the industry, which makes SIUI the first Chinese manufacturer to present such high-end but portable phased-array UT system, and one of the few countries possessing intellectual property right of phased-array technology in ultrasonic testing.

The off-the-shelf digital flaw detector series: portable CTS-4020E and CTS-9009, multi-channel CTS-808, though with conventional A-scan mode, their cost-effectiveness for general testing and optional API 5UE & AWS D1.1/D1.5 codes will surely address demands for special petroleum and welding application. SIUI can also accept OEM order for probe (conventional UT testing and phased-array) customization subject to specifications and purchase.

SIUI will keep upgrading its current product lines and deliver better solutions for ultrasonic testing.

Visit: SIUI (Shantou Institute of Ultrasonic Instruments Co.,Ltd.)

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