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|NDT.net Issue - 2010-04 - NEWS ||NDT.net Issue: 2010-04|
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)
Hamamatsu Microfocus X-ray Sources (MFX) Wins Prism AwardHamamatsu Photonics32, Hamamatsu-city, Japan
Hamamatsu Photonics is a proud recipient of a Prism Award, given in recognition of their MicroFocus X-ray Sources (MFX). The Prism Awards for Photonics Innovation is an international competition for companies that realise innovative products that break conventional ideas, solve problems and improve life with photonics technology. This prestigious Award was presented to Hamamatsu Photonics during a gala ceremony held during the SPIE Photonics West exhibition in San Francisco, America and was attended by approximately 400 leaders from the photonics industry.
Hamamatsu Photonics produce a wide range of microfocus X-ray sources, that are ideal for the non-destructive inspection of metallic components used in automotive, industrial, aerospace and electronic industries. The winning MFX source is a 160kV open type, featuring a 0.25µm resolution and high output intensity. A small focal point prevents blurring of X-ray images and delivers a sharp enlarged image.
The MFX sources are available in either open or sealed configurations consisting of an X-ray head, power supply, cooler and control electronics. Open type sources are capable of spot sizes of < 1 µm enabling a magnification of up to 1000 times. The output power of these sources is controlled by adjusting the X-ray tube voltage. This can range from 20 kV to 230 kV for some open type MFX sources (giving a maximum power output of 240 W), which is useful for the detection of different materials, from lower density plastics to metallic components.
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