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iCT 2020 |Website|

10th Conference on Industrial Computed Tomography (iCT) 2020, 4-7 Feb, Wels, Austria

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Table of Contents
1 Articles in
Issue: 2020-07-01      Search  
Title / Author(s) / Keywords Session
Artefact reduction and Optimisation
Fri 10:50 Room 1
Deblurring Sinograms Using a Covolutional Neural Network to Achieve Fast X-ray Computed Tomography Scanning
R. Yuki, Y. Ohtake19, H. Suzuki19
Department of Precision Engineering; University of Tokyo66, Tokyo, Japan
Radiographic Testing (RT), X-ray CT, acceleration, Deep convolutional neural network, deblurring

Artefact reduction and Optimisation
Fri 10:50 Room 1
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