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NDT.net Issue - 2013-04 - NEWS
NDT.net Issue: 2013-04
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)
NEWS

ETher NDE ETi-200multi-frequency and multi-channel flaw detection

ETher NDE10, Harpenden, Hertfordshire, United Kingdom

The ETher NDE ETi-200 is designed to offer advanced multi-frequency and multi-channel flaw detection housed in the smallest portable EC package on the market. ETher NDE specialises in Eddy Current NDT equipment and probes and the team have over 150 collective years of NDT experience including designing and manufacturing quality Eddy Current NDT flaw detectors.

Appealing to all sectors within NDT, the ETi-200 allows the Operator to programme not only frequency, but also many other advanced functions. With single-Probe operation, the ETi-200 can multiplex eight Channels. Alternately with two Probes connected the ETi-200 allows any mix of eight channels across two Probes. The ETi-200 has been designed to be rugged and built with a cast aluminium chassis overlaid with rubber over-moulding (meeting IP54 standards) to withstand the harshest of conditions.

The ETi-200 weighs just 2.8kg (6.2lbs) with a compact footprint that has been ergonomically designed with the end-user in mind. The compact size of the ETi-200 does not mean that the screen has been neglected. The ETi-200 boasts an impressive 7” diagonal 800 x 480 pixel colour TFT display that can be presented in one, two or four panes. Further technical advantages that the ETi-200 offers include:

  • Allowing USB peripherals (e.g. memory stick, mouse, keyboard)
  • Ethernet communication featuring a full-sized SD Card interface
  • “Smart Wheel” for rapid navigation through the ETi-200 features
  • “Direct Keys” to access key features quickly and easily

For full product details see: www.ethernde.com.

 
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