- since 1996 -
|Beta-Version of this Page View|
|NDT.net Issue - 2016-04 - NEWS ||NDT.net Issue: 2016-04|
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)
Hamamatsu New MEMS FPI SensorHamamatsu Photonics32, Hamamatsu-city, Japan
Hamamatsu Photonics introduces the latest development in MEMS (Micro-Electro-Mechanical Systems) technology with the MEMS FPI C13272; a single element detector that is able to give spectral information by utilising a Fabray-Perot Interferometer.
A voltage controls the size of the gap between two mirrors in a MEMS structure. The size of this gap determines the wavelength of light that is allowed to pass through. By quickly changing the voltage across these mirrors, the structure acts as a tuneable filter. This means that the user effectively has a spectrometer but with the low cost and small footprint of a single element sensor.
Such a device opens up exciting avenues in applications like atmospheric measurement; where handheld devices require components that are low size and low power consumption.
For further information contact us on 01707 294 888, email: firstname.lastname@example.org or visit our website: www.hamamatsu.com