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|NDT.net Issue - 2008-07 - NEWS ||NDT.net Issue: 2008-07|
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)
World's First Handheld XRF to Include Silicon Drift Detector (SDD)Bruker AXS GmbH2, Karlsruhe, Germany
With this announcement, the Bruker AXS Handheld business, previously known as Keymaster Technologies Inc., builds on its long tradition of technology leadership in the handheld XRF industry that includes:
2001 - First tube-based handheld XRF
The revolutionary TRACERturboSD with integrated SDD offers unparalleled speed, sensitivity and energy resolution, previously found only in more expensive laboratory systems. Now all handheld XRF customer segments can benefit from these compelling performance advantages in their analytical work. In the aerospace industry, the proprietary Bruker SDD technology enables TRACERturboSD users to better and faster analyze sophisticated light element alloys, even without the use of a vacuum or helium attachment. In the general metals analysis markets the TRACERturboSD offers higher speed, sensitivity and selectivity for many demanding handheld XRF applications.
This detector provides a major improvement in the analytical performance of handheld alloy analyzers. The measurement precision is improved by a factor of two to three times, in addition to making the measurement of light elements such as Mg, Al and Si possible when operating in air mode. The TRACERturboSD provides a new capability of measuring aluminum in titanium alloys and magnesium and silicon in aluminum alloys, with no vacuum or helium required. For additional sensitivity the well known joint Bruker-NASA vacuum technology, can be combined with the SDDto provide the best sensitivity possible in a handheld XRF instrument. In addition, the speed and resolution provided by the detector make the analysis of difficult alloys, like B-1900Hf, a routine analysis.
The TRACERturboSD includes all of the standard features of the highly-regarded Bruker S1 Tracer analyzer, such as Grade ID and chemistry, a unique PASS/FAIL analysis capability and the largest Grade library in the industry. The capabilities of the TRACERturboSD make it the ideal analyzer for the measurement of all types of aerospace alloys. In addition to the new high-end TRACERturboSD, Bruker AXS continues to offer the standard S1 Tracer" handheld instrument with traditional SiPIN diode technology for routine analysis
Frank Laukien, President and CEO of Bruker Corporation, said: "We are very proud to announce this cutting-edge next-generation handheld XRF, incorporating our proprietary XFlash SDD technology. We believe the TRACERturboSD will have enormous analytical benefits for handheld XRF users in the aerospace industry, and it truly represents a disruptive technology in this field."
John Landefeld, Vice President of Bruker AXS Handheld, indicated: "This breakthrough continues our tradition of technology leadership, going back to the initial introduction of tube-based XRF handhelds in 2001. Following the joint NASA-Bruker development of vacuum technology for handhelds in 2004, Bruker proves, once again, to be the technology leader in handheld XRF instrumentation."
"The aerospace industry will be particularly pleased to find that high-end handheld XRF can now approach the capabilities of laboratory systems, added John Patterson, Director of Marketing and Product Management of Bruker AXS Handheld.
The TRACERturboSD has just been introduced to the aerospace industry at the Aeromat Conference & Exposition which took place June 23 through 26 in Austin, Texas. Bruker will also exhibit the new handheld SDD instrument at the Denver X-ray Conference on August 4-8 in Denver, Colorado. For more TRACERturboSD information, visit: www.bruker-axs.com/handheld
ABOUT BRUKER AXS
FOR FURTHER INFORMATION:
John I.H. Patterson
Keywords: Radiographic Testing (RT) (1528), x-ray fluorescence (46), materials characterization (653), instrumentation (453),