where expertise comes together - since 1996 -

The Largest Open Access Portal of Nondestructive Testing (NDT)

Conference Proceedings, Articles, News, Exhibition, Forum, Network and more

where expertise comes together
- since 1996 -
Beta-Version of this Page View
NDT.net Issue - 2010-10 - NEWS
NDT.net Issue: 2010-10
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)
NEWS

GE?s First High Resolution X-ray CT Symposium Proves Great Success

GE Inspection Technologies GmbH310, Hürth, Germany

Wunstorf, Germany - September 20, 2010 - The first high resolution X-ray computed tomography (CT) symposium hosted by the phoenix|x-ray product line of GE’s Inspection Technologies business has proved an eminent success, attracting more than120 delegates from 20 countries. With papers presented by 34 speakers and with a further 14 poster presentations, the symposium took place in Dresden, Germany from 31st August to 2nd September.

The aim of the event was to provide a forum for information-sharing and discussion on the latest developments in CT technology and its application in fields as diverse as 3D metrology, materials science research, geosciences, failure analysis and non-destructive testing and biomedical research.

As Juan Mario Gomez, General Manager, Radiography at GE’s Inspection Technologies business, enthused, “The success of the symposium is further demonstration of the increasing importance of this exciting technology and I am proud that we have been able to take the leading role in arranging this event, which brought together experts and CT users from all over the world – from Iceland to Israel and from the USA to Russia. There were papers from universities and academic institutions explaining the involvement of CT in the latest cutting edge research, as well as presentations from industrial and laboratory CT users, who are using the technology to solve real problems, save inspection time or gain greater insight into processes and the structural behaviour of specific materials. Olive Brunke, the phoenix CT product manager, who co-chaired the symposium, also took the opportunity to introduce the latest phoenix developments in hardware and software for high resolution CT systems.”

CT is a radiography technique whose origins lie in the healthcare sector, where it is very much used in the diagnosis of a wide range of medical conditions. In operation, X-ray images are taken of an object at precise angular intervals as it rotates. These individual projections are then numerically reconstructed by sophisticated software to produce a high resolution, 3D volume image. Just a few of the current applications of CT include inspecting castings for defects, checking the integrity of pcbs and electronic circuits, examining the deformation of composite materials under impact, petrophysical research to help in oil reservoir management, qualification of injection moulded polymer parts, visualisation of biological tissues and imaging plant roots to investigate root/soil interaction.

The phoenix|x-ray product line of GE’s Inspection Technologies business is a world leader in the design, development and manufacture of microfocus and nanofocus CT systems. It combines its heritage knowledge of the technology with GE Healthcare’s expertise and experience in medical CT and digital radiography.

 
Visit: GE Inspection Technologies GmbH

Feedback: ()

Share:
More from "GE Inspection Technologies" (5 of 465)
2019-11Optimization of Image Quality and Throughput at CT Scans of Large Parts
2019-11Using Experiment and Simulation to Understand the Effects of Source Filtering on Scatter Reduction for Industrial X-ray Computed Tomography
2019-08Phased-Array Anwendungen mit frei modulierbaren Ultraschallsendern
2019-08Innovative Systemplattform für die Ultraschallprüfung
2019-08Entwicklung verbesserter AVG-Diagramme für die etablierten Winkelprüfköpfe
... All 465 Details >
Share...
We use technical and analytics cookies to ensure that we will give you the best experience of our website - More Info
Accept
top
this is debug window