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NDT.net Issue - 2012-10 - NEWS
NDT.net Issue: 2012-10
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)

NIKON METROLOGY INTRODUCES IMPROVED Nikon CFI60-2 Objective Lens AND Industrial Microscope Eclipse LV-N

Nikon Metrology, Inc.11, Brighton, MI, USA

LV-N Industrial Microscope

CFI60-2 industrial objective lenses
September 24, 2012 – Brighton, MI – Nikon Metrology announced significant improvements in optical performance with the CF160-2 Series Objective Lenses for Industrial Microscopy.

Development Concept
In 1999, Nikon introduced the infinity optics CFI60 series to the industrial field. Since then it has been very well accepted with its high NA and long working distance coupled with the excellent overall optical performance. Nikon now introduces the CFI60-2 series further improving optical performance, extending working distance and making every objective in the series “Semi Apo” or higher in class. This is possible by integrating the advanced “Phase Fresnel Lens” technology into the microscope optics. At the same time, Nikon has revamped its Industrial Microscope LV series to have a newer look and an improved connectivity to digital imaging systems. With the LV-N series and CFI60-2 series, Nikon will “meet needs and exceed expectations” of industry.

Key Features
1. Superior Optical Performance
Using the Phase Fresnel Lens, Nikon has extended working distance and at the same time improved chromatic aberration correction, which has been difficult to accomplish previously. This has been achieved by using the characteristics of a refractive lens and a diffractive lens. With this change all CFI60 industrial objective lens will become Semi-Apochromatic or Apochromatic in classification.

2. Enhanced Ease of Use
Nikon will add a manual intelligent nosepiece to the LV-N series. In combination with the nosepiece position indicator LV-INAD, the intelligent nosepiece will output nosepiece position to enable auto-calibrated measurements and scale display. The interface for LV150NA and LV-NCNT has been upgraded to USB improving the overall connectivity to PC.

3. Excellent Value
Nikon will also add a LED light source base microscope LV150NL to offer customers a low cost high value option to overcome budget restraints. The LV150NL will have a dedicated LED Epi Illuminator LV150NL-LED EPI optimized for Episcopic bright field, simple polarizing and DIC observation.

Nikon Metrology offers the most complete and innovative metrology product portfolio, including state-of-the-art vision measuring instruments complemented with optical inspection and mechanical 3D metrology solutions. These reliable and innovative products respond to the advanced inspection requirements of manufacturers active in consumer, automotive, aerospace, electronics, medical and other industries. For more information, visit www.nikonmetrology.com. Product-related inquiries may be directed to Nikon Metrology, Inc. at 810-220-4360 or Marketing_US@NikonMetrology.com

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