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NDT.net Issue - 2013-05 - NEWS
NDT.net Issue: 2013-05
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)

High Speed X-ray TDI Camera for Demanding Inspection Applications

Hamamatsu Photonics32, Hamamatsu-city, Japan

Hamamatsu Photonics are pleased to announce a brand new device for low level X-ray imaging, the C12200-321 X-ray TDI (Time Delay Integration) camera. This new camera is designed for high speed inspection of moving objects. Compared to conventional X-ray line-scan cameras using CMOS arrays, the TDI CCD at the heart of the C12200-321 provides greater sensitivity, high resolution (sub 50 micron pixel size) and high dynamic range.

TDI CCDs employ a stack of linear arrays, aligned with and synchronised to the movement of a moving object to produce a continuous video image. As the image moves from one line to the next, the integrated charge moves along with it, providing higher resolution images at lower light levels than is possible with a conventional line-scan camera. This allows use of the C112200-321 in industrial applications requiring higher speed and / or higher image quality.

The camera incorporates a fibre-optic plate to shield the CCD from incident X-rays and the CsI scintillator is optimised for a 25 kV to 90 kV operation range. The X-ray camera module provides a 12 bit digital output via a CameraLink interface and operates from a 15V power supply. The C12200-321 features 4608 x 128 pixels. With a large CCD pixel size of 48 micron, this gives a total imaging area of up to 221 mm x 6 mm and a readout speed up to 36.8m/min.

The C12200-321 can be adopted in a wide variety of NDT inspection applications including PCB inspection, surface mount component inspection, packaging, pharmaceuticals, pipelines, moulded metallic components, tyres, turbines, building materials, bone and glass in food stuffs, bottles, tin cans and many more.

For further information contact us on 01707 294 888, email: info@hamamatsu.co.uk or visit our website: www.hamamatsu.com

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