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|NDT.net Issue - 2014-08 - NEWS ||NDT.net Issue: 2014-08|
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)
GE Shares Success Highlights from 10th Annual X-Ray ForumGE Inspection Technologies67, Wunstorf, Germany
Customer Application Presentations and System and Software Tutorials for the Latest Digital X-Ray Technology Inspire More than 140 Customers and Industry Professionals
Ahrensburg, Germany – July 9, 2014 — More than 140 participants from 23 countries attended GE (NYSE: GE) Measurement & Control’s 10th annual X-Ray User Forum in Hamburg, Germany last month to share best practices for radiography inspection and learn more about the latest advances in the field.
From June 16-18, conference attendees explored the widest range of X-ray and CT inspection systems and components ever assembled, and listened to presentations on scientific and industrial applications from some of the world’s leading experts.
The GE customer applications presented at the forum ranged from the implementation of advanced helix CT at a Volkswagen foundry to high resolution CT applications between material development and serial part production at BASF.
Other topics covered at this year’s conference included:
Attendees also participated in practical workshops with software tutorials for advanced digital X-ray technology.
“This was truly a learning conference,” said Kermit Hoffman, general manager for GE Measurement & Control, a GE Oil & Gas division. “The X-Ray User Forum continues to be a successful platform for GE to engage with our customers and drive a different level of understanding around inspection processes, productivity, and quality by leveraging the technology that we’ve created.”
Started in 2001 as the phoenix|x-ray electronics inspection customer forum, the X-Ray User Forum has grown into a customer event for the whole GE Measurement & Control radiography line combining technology and application presentations, hardware and software demos and workshops, evening events, and a GE plant tour.
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