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NDT.net Issue - 2018-04 - NEWS
NDT.net Issue: 2018-04
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)

Welcome to 32nd Control to experience SIUI's new product lineup

SIUI (Shantou Institute of Ultrasonic Instruments Co.,Ltd.)14, Shantou, China

As the 32nd Control (24-27 April 2018) approaching, we sincerely invite you to visit SIUI booth No.6517 to experience our new product lineup and feel our dedication to ultrasound innovation.

Featured products will be on the show such as upgradeable from conventional UT to PA/TOFD/TG ultrasonic flaw detector: SyncScan, advanced conventional UT & thickness measurement ultrasonic flaw detector: Smartor, other various thickness gauge, crawlers, etc. Welcome to our booth and enjoy the show!

Visit: SIUI (Shantou Institute of Ultrasonic Instruments Co.,Ltd.)

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