where expertise comes together - since 1996 -

The Largest Open Access Portal of Nondestructive Testing (NDT)

Conference Proceedings, Articles, News, Exhibition, Forum, Network and more

where expertise comes together
- since 1996 -

NDT.net Issue - 2008-09 - NEWS

Andor Technology Enhances its Range of Cameras with a New USB X-Ray Capability

Andor12, Belfast, Ireland
Radiographic Testing (RT), Lithography, X-ray microscopy, instrumentation
NDT.net Journal
Issue: 2008-09
Belfast, Northern Ireland, 19 August 2008 – Andor Technology plc (Andor), a world leader in scientific imaging and spectroscopy solutions, today announced the launch of their new iKon-M X-ray camera. This extension to the established ‘iKon’ family of low light imaging cameras is designed to deliver high-performance solutions to direct detection X-ray needs, and is available in two variants: DO and DY. The DO variant interfaces easily with vacuum chambers, whereas the DY variant is a ‘stand-alone’ camera with a beryllium input window.

The new camera offers very low read noise floor, high QE across the X-ray, XUV and EUV energy ranges, and boasts negligible dark current with thermoelectric cooling to as low as -90ºC, ideal for maximizing signal to noise for low photon flux applications. Readout speeds of up to 2.5 MHz enable faster frame rate imaging of dynamic processes.

Dr Colin Coates, Market Development Manager within Andor Technology, said; "We are delighted to announce the launch of this latest addition to our X-ray family of cameras. The iKon-M X-ray offers unparalleled thermoelectric cooling and ultra low noise readout, making it ideal for a range of applications including; Soft X-ray imaging, Lithography, X-ray microscopy, Beam profilometry, and Plasma diagnostics”.

For more information, please visit

More of Andor published in NDT.net
2014-03-01: Andor Technology joins Oxford Instruments to drive growth
2010-06-01: Highly-sensitive EMCCD camera helps redraw the boundaries of super-resolution 3D imaging
2010-02-01: Andor Technology Pushes Interline CCD Performance Even Further ...
2009-11-01: First direct measurements of trace pollutants in fresh vegetables using laser plasma spectroscopy
2009-03-01: New camera vendor delivers more efficient fault detection for fast inline solar cell inspection.
2009-02-01: New Spectrograph with Imaging Capability launched at Photonics West
2008-12-01: Andor Builds upon its Strong Position in Japan
2008-11-01: New Portable 1064nm Raman Spectroscopy
2008-11-01: More Power and Flexibility for Live Cell Imaging Software
2008-10-01: Innovative ?super-resolution? microscopy method developed using Andor?s iXon+ EMCCD cameras.
All 12 Articles & News of Andor in NDT.net

We use technical and analytics cookies to ensure that we will give you the best experience of our website - More Info
this is debug window