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NDT.net Issue - 2008-12 - NEWS
NDT.net Issue: 2008-12
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)

Skyray XRF Releases Newest Model for Coating Thickness Measurements

Skyray XRF3, Georgetown, USA

Seaford, DE - Skyray XRF has released the newest addition to its low-cost x-ray fluorescence instrument line; the Thick-800. Developed specifically for measuring plating thickness, the Thick-800 XRF can provide measurements of single-layer, multi-layer, thin-film coatings and solders with composition.

The Thick-800 XRF Instrument from Skyray XRF is the first unit in the product line-up to feature a top-down measurement system. This style allows for a sample stage with three-dimensional movement; with the press of a button the sample can move from point to point on a sample or up and down if needed. The top-down measurement system also allowed Skyray XRF to offer a three-sided chamber door so that users can measure smaller samples with the door closed (chamber size of 20"x14"x5") or open the door to create a 'slotted chamber' and fit larger samples or printed circuit boards.

This system utilizes an electro-cooled Silicon-PIN semiconductor detection system, which offers a resolution of 149-160eV and does not require Liquid Nitrogen (LN2). To insure sample alignment accuracy, the Thick-800 was developed with a color-camera sample viewing system and double laser position technology. Many organizations that utilize XRF for coating thickness measurements look to reconditioned instruments to limit costs, but the low-cost Thick-800 allows a company with any sized budget to utilize the newest, most reliable technology.

"Our focus to this point has been offering low-cost, high-performing units for precious metal analysis and hazardous substance detection," stated Scott Kramer, Director of Sales and Marketing for Skyray XRF. "The Thick-800, in addition to the EDX-600, allows us to offer low cost testing solutions for another common application."

Skyray XRF is the North American representative of an international leader in x-ray fluorescence technology. Overviews of the full product line, applications and XRF technology can be found at www.skyrayxrf.com.

Keywords: Radiographic Testing (RT) (1532), x-ray fluorescence (46), coating (64), thickness (191), instrumentation (454),
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