- since 1996 -
|Beta-Version of this Page View|
|NDT.net Issue - 2009-02 - NEWS ||NDT.net Issue: 2009-02|
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)
PerkinElmer Introduces New High-Speed Digital X-Ray Detectors for 24/7 NDT ApplicationsPerkinElmer3, Waltham, MA, USA
New Radiation-hardened Detectors Provide High-Speed Real-time Industrial Inspection; Showcasing at ASNT's Fall Conference and Quality Testing Show in Charleston, SC
Charleston, SC - November 10, 2008 - The American Society for Nondestructive Testing's Fall Conference and Quality Testing Show, Booth 433 - PerkinElmer Optoelectronics, a global technology leader in digital imaging, specialty lighting and optical detection technologies, today announced it will showcase its new high-speed, high-throughput, digital x-ray detectors at the American Society for Nondestructive Testing's (ASNT) Fall Conference and Quality Testing Show on November 10-14 at the Charleston Area Convention Center in Charleston, South Carolina. This will mark PerkinElmer's first exhibition in North America of its digital imaging technologies for a range of industrial and medical applications, including metal casting inspection and diagnostic and therapeutic medical imaging. These technologies are an integral part of the Company's ongoing commitment to supporting health and environmental infrastructures around the globe. PerkinElmer's new amorphous silicon (a-Si) digital x-ray detectors offer twice the output speed of previous designs, with output up to 30 fps, while maintaining an industry- leading 16-bit resolution and the ability to produce real-time images. The detectors are radiation-hardened and designed to withstand the demanding, high energy test environments found in 24x7 production lines, making them the ideal choice for NDT applications including metal casting inspection, composite materials inspection, PCB testing, pipeline inspection, and various types of in-line manufacturing inspections.
"PerkinElmer is excited to exhibit our new a-Si digital x-ray detectors for industrial NDT applications at this important conference," said Brian Giambattista, Ph.D., president, digital imaging for PerkinElmer. "Recent enhancements to our x-ray detectors offer our customers the opportunity to perform critical real-time inspections more efficiently and cost-effectively," added Dr. Giambattista.
At the ASNT Fall Conference and Quality Testing Show, PerkinElmer will showcase two models in its new XRD N ES Detector Series: