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NDT.net Issue - 2010-03 - NEWS
NDT.net Issue: 2010-03
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)
NEWS

SIUI attends ASNT and APCNDT 2009

SIUI (Shantou Institute of Ultrasonic Instruments Co.,Ltd.)15, Shantou, China

Recently SIUI exhibited in two NDT events: ASNT Fall Conference and Quality Testing Show 2009 (October 19-21 in the USA); and the 13th Asia-Pacific Conference on Non-Destructive Testing (APCNDT 2009, November 9-12 in Japan). In these two shows, which exert significant influence upon NDT industry, exhibitors showcased their latest products and NDT techniques, exchanged and shared advanced knowledge in non-destructive testing with visitors. The debut of phased-array ultrasonic flaw detector CTS-602 attracted great attention in the industry, which makes SIUI the first Chinese manufacturer to present such high-end but portable phased-array UT system, and one of the few countries possessing intellectual property right of phased-array technology in ultrasonic testing.

The off-the-shelf digital flaw detector series: portable CTS-4020E and CTS-9009, multi-channel CTS-808, though with conventional A-scan mode, their cost-effectiveness for general testing and optional API 5UE & AWS D1.1/D1.5 codes will surely address demands for special petroleum and welding application. SIUI can also accept OEM order for probe (conventional UT testing and phased-array) customization subject to specifications and purchase.

SIUI will keep upgrading its current product lines and deliver better solutions for ultrasonic testing.

 
Visit: SIUI (Shantou Institute of Ultrasonic Instruments Co.,Ltd.)

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