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where expertise comes together
- since 1996 -
"Xradia Inc." Search Results: 5
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Publications
NDT.net Journal (4)
iCT 2008 (1)

Type
News (4)
Articles (1)


Languages
English (4)
German (1)

Title / Author(s) / Keywords PublicationDate
open document Xradia Announces VersaXRM-410 to Bring Revolutionary X-ray Microscope Technology to More Researchers
Xradia Inc.5, Pleasanton, CA, USA
NEWS
NDT.net Journal
2013-05
open document Xradia Highlights Ground-breaking Research Enabled by VersaXRM 3D X-ray Microscopes
Xradia Inc.5, Pleasanton, CA, USA
NEWS
NDT.net Journal
2013-05
2011-06 iCT 2008 Spezielle tomografische Verfahren
Nano-Röntgentomografie für Prozesskontrolle und Fehleranalyse in der Halbleiterindustrie
E. Zschech12, S. Braun2, W. Yun3
1AMD Saxony LLC & Co. KG, Dresden, Germany
2Fraunhofer-Institut für Werkstoff- und Strahltechnik, Dresden, Germany
3Xradia Inc.5, Pleasanton, CA, USA
NDT-wide, Penetrant Testing (PT), semiconductor, focusing optics, x-ray microscopy and tomography, multilayer laue lense, precision coatings

DE
iCT 2008
Session: Spezielle tomografische Verfahren
2011-06
open document Xradia Unveils New 3D X-ray Microscope with Industry's Largest Working Distance at Highest Resolution
Xradia Inc.5, Pleasanton, CA, USA
NEWS
NDT.net Journal
2011-04
open document Xradia Announces X-ray Fluorescence Imaging Tool
Xradia Inc.5, Pleasanton, CA, USA
Radiographic Testing (RT), X-ray Fluorescence, semiconductor

NEWS
NDT.net Journal
2005-07
   
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