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iCT 2019

9th Conference on Industrial Computed Tomography (iCT) 2019, 13-15 Feb, Padova, Italy

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Keywords Authors & Institutions
"Brno University of Technology (BUT)" Search Results: 4 in Date '2019-03-01'      Search  
Title / Author(s) / Keywords Session
Materials Characterization
Fri 10:50 Auditorium
Use of the industrial X-ray computed microtomography to address scientific questions in developmental biology
M. Tesařová12, T. Zikmund19, M. Kaucká22, I. Adameyko22, J. Kaiser19
1Central European Institute of Technology; Brno University of Technology (BUT)227, Brno, Czech Republic
2Department of Physiology and Pharmacology; Karolinska Institutet3, Stockholm, Sweden
microCT, 3D imaging, developmental biology, embryo

Materials Characterization
Fri 10:50 Auditorium
New Methods & Optimization
Wed 13:50 Auditorium
Helical XCT measurement for correlative imaging
A. Břínek3, J. Lázňovský3, T. Zikmund9, J. Salplachta3, J. Kaiser9
Central European Institute of Technology; Brno University of Technology (BUT)227, Brno, Czech Republic
X-ray computed tomography, Laser-induced breakdown spectroscopy, Correlative imaging

New Methods & Optimization
Wed 13:50 Auditorium
Poster exhibition
Thu 16:00 Agora
CCD and scientific-CMOS detectors for submicron laboratory based X-ray Computed tomography
J. Salplachta13, T. Zikmund19, M. Horváth22, Y. Takeda32, K. Omote32, L. Pina24, J. Kaiser19
1Central European Institute of Technology; Brno University of Technology (BUT)227, Brno, Czech Republic
2Rigaku Innovative Technologies Europe, s.r.o.,, Praha, Czech Republic
3Rigaku Corporation2, Tokyo, Japan
X-ray imaging, X-ray Computed Tomography, image detectors, CCD, sCMOS, image quality evaluation

Poster exhibition
Thu 16:00 Agora
Poster exhibition
Thu 16:00 Agora
Voxel size and calibration for CT measurements with a small field of view
P. Blažek12, J. Šrámek22, T. Zikmund19, D. Kalasová13, V. Hortvík2, P. Klapetek12, J. Kaiser19
1Central European Institute of Technology; Brno University of Technology (BUT)227, Brno, Czech Republic
2Department of Primary Nanometrology and Technical Length; Czech Metrology Institute (CMI)4, Prague, Czech Republic
Radiographic Testing (RT), CT, nano-CMM, SIOS NMM-1, voxel size calibration, edge detection calibration

Poster exhibition
Thu 16:00 Agora
   
Actual Cooperations
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