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iCT 2019 |Website|

9th Conference on Industrial Computed Tomography (iCT) 2019, 13-15 Feb, Padova, Italy

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Keywords Authors & Institutions
"Brno University of Technology (BUT)" Search Results: 4 in Date '2019-03-01'      Search  
Title / Author(s) / Keywords Session
Materials Characterization
Fri 10:50 Auditorium
Use of the industrial X-ray computed microtomography to address scientific questions in developmental biology
M. Tesařová12, T. Zikmund17, M. Kaucká22, I. Adameyko22, J. Kaiser17
1Central European Institute of Technology; Brno University of Technology (BUT)224, Brno, Czech Republic
2Department of Physiology and Pharmacology; Karolinska Institutet3, Stockholm, Sweden
microCT, 3D imaging, developmental biology, embryo

 
Materials Characterization
Fri 10:50 Auditorium
New Methods & Optimization
Wed 13:50 Auditorium
Helical XCT measurement for correlative imaging
A. Břínek2, J. Lázňovský2, T. Zikmund7, J. Salplachta2, J. Kaiser7
Central European Institute of Technology; Brno University of Technology (BUT)224, Brno, Czech Republic
X-ray computed tomography, Laser-induced breakdown spectroscopy, Correlative imaging

 
New Methods & Optimization
Wed 13:50 Auditorium
Poster exhibition
Thu 16:00 Agora
CCD and scientific-CMOS detectors for submicron laboratory based X-ray Computed tomography
J. Salplachta12, T. Zikmund17, M. Horváth22, Y. Takeda3, K. Omote3, L. Pina24, J. Kaiser17
1Central European Institute of Technology; Brno University of Technology (BUT)224, Brno, Czech Republic
2Rigaku Innovative Technologies Europe, s.r.o.,, Praha, Czech Republic
3Rigaku Corporation, Tokyo, Japan
X-ray imaging, X-ray Computed Tomography, image detectors, CCD, sCMOS, image quality evaluation

 
Poster exhibition
Thu 16:00 Agora
Poster exhibition
Thu 16:00 Agora
Voxel size and calibration for CT measurements with a small field of view
P. Blažek1, J. šrámek2, T. Zikmund17, D. Kalasová13, V. Hortvík2, P. Klapetek1, J. Kaiser17
1Central European Institute of Technology; Brno University of Technology (BUT)224, Brno, Czech Republic
2Department of Primary Nanometrology and Technical Length; Czech Metrological Institute- CMI OI Prague4, Prague, Czech Republic
Radiographic Testing (RT), CT, nano-CMM, SIOS NMM-1, voxel size calibration, edge detection calibration

 
Poster exhibition
Thu 16:00 Agora
   
Actual Cooperations
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