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- since 1996 -

WCNDT 2000 |Website| by NDT.net

15th World Conference on NDT - 2000 - Rome (Italy)

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Keywords Authors & Institutions
"YXLON International GmbH"
Search Results: 2
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Title / Author(s) / Keywords SessionDate
2000-11 WCNDT 2000,
Improvement in automated Aluminum Casting Inspection by Finding Correspondence of Potential Flaws in Multiple Radioscopic Images
N. Parspour1, D. Filbert28, D. Mery314
1YXLON International GmbH186, Hamburg, Germany
2Institute for Measurement Technology and Control Engineering; Technische Universität (TU) Berlin79, Berlin, Germany
3Institute for Measurement Technology and Control Engineering; Universidad de Santiago de Chile10, Santiago de Chile, Chile
Radiographic Testing (RT), filmless radiography, aluminium, casting

 
2000-11
2000-11 WCNDT 2000,
Quantitative Material Inspection with Coherent X-Ray Scattering
J. Kosanetzky1, O. Rokitta12, H. Bomsdorf22, T. Müller2
1YXLON International GmbH186, Hamburg, Germany
2Fachbereich 8 - Physik; University of Wuppertal4, Wuppertal, Germany
Radiographic Testing (RT), x-ray diffraction, pattern recognition, aerospace, composite

 
2000-11
   
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