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"Nikon Metrology, Inc." Search Results: 1
Title / Author(s) / Keywords PublicationDate
2019-03 iCT 2019 Metrology
Thu 09:00 Auditorium
Uncertainty for uncorrected measurement results in X-ray computed tomography
H. Villarraga-Gómez1, S. Smith22
1Nikon Metrology, Inc.11, Brighton, MI, USA
2University of North Carolina3, Charlotte, NC, USA
NDT-wide, Measurement Uncertainty, microtomography, Dimensional metrology, Cone beam computed tomography, nondestructive evaluation, nondestructive testing, X-ray computed tomography, CMM, Industrial computed tomography, non-destructive inspection, bias, RSSU, SUMU, MPE (maximum permissible error), Nikon Metrology

iCT 2019
Session: Metrology
Thu 09:00 Auditorium
2019-03
   
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