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- since 1996 -
NDCM 2011

12th International Symposium on Nondestructive Characterization of Materials (NDCM-XII), Blacksburg, Virginia, USA, June 19-23, 2011

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Keywords Authors & Institutions
"Waygate Technologies (former GE Inspection Technologies)"
Search Results: 1 in Date '2013-05-01'      Search  
Title / Author(s) / Keywords Session
Advanced Techniques
X-ray Diffraction as a Tool for Automated Residual Stress Analysis and a Non-synchrotron Based Nanofocus X-ray Computed Tomographic Technique for Materials Characterization and Metrology
J. Santillan1, R. Stabenow2, M. Klatt2, A. Haase23, O. Brunke223
1GE Phoenix X-ray, San Carlos, CA, USA
2Phoenix X-ray; GE Inspection Technologies69, Wunstorf, Germany
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