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where expertise comes together
- since 1996 -
NDE-India 2014

National Seminar & Exhibition on Non-Destructive Evaluation, NDE 2014, Pune, December 4-6, 2014

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Keywords Authors & Institutions
"Waygate Technologies (former GE Inspection Technologies)"
Search Results: 2 in Date '2015-06-01'      Search  
Title / Author(s) / Keywords Session
Computerised Tomography
High resolution industrial CT systems: Advances and comparison with synchrotron-based CT
O. Brunke123, . Neuser1, A. Suppes111, S. Changdar23
1Phoenix X-ray; GE Inspection Technologies69, Wunstorf, Germany
2GE India Indust rials PVt Ltd4, Mumbai, India
Computerised Tomography
A New Probe Concept for increased Flaw Sizing Accuracy by DGS method
W. Kleinert119, S. Gnanasekaran2
1Waygate Technologies (former GE Inspection Technologies)313, Hürth, Germany
2GE India Indust rials PVt Ltd4, Mumbai, India
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