where expertise comes together - since 1996 -

The Largest Open Access Portal of Nondestructive Testing (NDT)

Conference Proceedings, Articles, News, Exhibition, Forum, Network and more

where expertise comes together
- since 1996 -
NDE-India 2014

National Seminar & Exhibition on Non-Destructive Evaluation, NDE 2014, Pune, December 4-6, 2014

Share ...     

Keywords Authors & Institutions
"Waygate Technologies (former GE Inspection Technologies)"
Search Results: 2 in Date '2015-06-01'      Search  
Title / Author(s) / Keywords Session
Computerised Tomography
High resolution industrial CT systems: Advances and comparison with synchrotron-based CT
O. Brunke123, . Neuser1, A. Suppes111, S. Changdar23
1Phoenix X-ray; GE Inspection Technologies69, Wunstorf, Germany
2GE India Indust rials PVt Ltd4, Mumbai, India
Computerised Tomography
Ultrasonic
A New Probe Concept for increased Flaw Sizing Accuracy by DGS method
W. Kleinert119, S. Gnanasekaran2
1Waygate Technologies (former GE Inspection Technologies)313, Hürth, Germany
2GE India Indust rials PVt Ltd4, Mumbai, India
Ultrasonic
   
Actual Cooperations
Share...
We use technical and analytics cookies to ensure that we will give you the best experience of our website - More Info
Accept
top
this is debug window