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Reliability 2009 |Website|

4th European-American Workshop on Reliability of NDE, June 2009, Berlin, Germany

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Keywords Authors & Institutions
"Waygate Technologies (former GE Inspection Technologies)"
Search Results: 1 in Date '2010-01-01'      Search  
Title / Author(s) / Keywords Session
Progress in Methods for Reliability - Model-Assisted Probability of Detection (MAPOD)
New Information Object Definitions for DICONDE
M. Jobst14, P. Howard2, J. Hansen37, L. Arrowood4
1Waygate Technologies (former GE Inspection Technologies)313, Hürth, Germany
2GE Infrastructure-Aviation2, Cincinnati, Ohio, USA
3GE Sensing & Inspection Technologies6, St. Albans, United Kingdom
4National Security Complex, Oak Ridge, USA
Electromagnetic Testing (ET), eddy current, Radiographic Testing (RT), 3D Computed Tomography, x-ray imaging, Ultrasonic Testing (UT), Visual and Optical Testing (VT/OT), DICONDE, image, archive, communication
Progress in Methods for Reliability - Model-Assisted Probabi...
   
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