where expertise comes together - since 1996 -

The Largest Open Access Portal of Nondestructive Testing (NDT)

Conference Proceedings, Articles, News, Exhibition, Forum, Network and more

where expertise comes together
- since 1996 -
Reliability 2009 |Website|

4th European-American Workshop on Reliability of NDE, June 2009, Berlin, Germany

Share ...     

Keywords Authors & Institutions
"Waygate Technologies (former GE Inspection Technologies)"
Search Results: 1 in Date '2010-01-01'      Search  
Title / Author(s) / Keywords Session
Progress in Methods for Reliability - Model-Assisted Probability of Detection (MAPOD)
New Information Object Definitions for DICONDE
M. Jobst14, P. Howard2, J. Hansen37, L. Arrowood4
1Waygate Technologies (former GE Inspection Technologies)313, Hürth, Germany
2GE Infrastructure-Aviation2, Cincinnati, Ohio, USA
3GE Sensing & Inspection Technologies6, St. Albans, United Kingdom
4National Security Complex, Oak Ridge, USA
Electromagnetic Testing (ET), eddy current, Radiographic Testing (RT), 3D Computed Tomography, x-ray imaging, Ultrasonic Testing (UT), Visual and Optical Testing (VT/OT), DICONDE, image, archive, communication
Progress in Methods for Reliability - Model-Assisted Probabi...
Actual Cooperations
We use technical and analytics cookies to ensure that we will give you the best experience of our website - More Info
this is debug window