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Exhibitors (3)
Eclipse Scient.. 1
Materials Rese.. 2
Title / Author(s) / Keywords PublicationDate
Sizing and evaluation of planar defects based on Surface Diffracted Signal Loss technique by ultrasonic phased array
A. Ekhlas12, E. Ginzel298, M. Sorouri1
1Pars Leading Inspection Company2, Tehran, Iran
2Materials Research Institute101, Waterloo, Canada
Surface diffraction signals loss, detection, sizing, planar defects, crack sizing, phased-array ultrasound

NDT.net Journal
Near Field Length Compensation Options
E. Ginzel198, A. Ekhlas22, M. Matheson33, P. Cyr38, B. Brown45
1Materials Research Institute101, Waterloo, Canada
2Pars Leading Inspection Company2, Tehran, Iran
3Eclipse Scientific Products48, Waterloo, Canada
4Eurotechnology-Incon5, Aberdeen, United Kingdom
Ultrasonic Testing (UT), phased array, near field, Photoelastic visualisation

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