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"GE Inspection Technologies"
Search Results: 1 in Date '2007-10'      Search  
Title / Author(s) / Keywords Publication
DIR 2007 CT Systems
Nano CT : visualizing of internal 3D structures with submicrometer resolution,
E. Neuser15, A. Suppes11
Phoenix X-ray; GE Inspection Technologies69, Wunstorf, Germany
Radiographic Testing (RT), computed tomography (CT), 3D Computed Tomography, micro-CT, beam hardening, nanofocus, microfocus, nanoCT, 3D, reconstruction, tomography, semiconductor, metrology
DIR 2007
Session: CT Systems
   
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