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"GE Inspection Technologies"
Search Results: 4 in Date '2007-12'      Search  
Title / Author(s) / Keywords Publication
DGZfP 2007 Computertomographie
Von der Micro- zur nanoCT?: Neue Spielräume hochauflösender Computertomographie
E. Neuser15, A. Suppes11
Phoenix X-ray; GE Inspection Technologies69, Wunstorf, Germany
Radiographic Testing (RT), computed tomography (CT), microfocus x-ray, 3D Computed Tomography, flat-panel detector, micro-CT, microtomography, Resolution, beam hardening, nano-CT, 3D, reconstruction, reconstruction algorithm, tomography
DE
DGZfP 2007
Session: Computertomographie
DGZfP 2007 Gerätetechnik
nanotom?: Computertomographie mit Submikrometerauflösung
E. Neuser15, D. Sommerfeld
Phoenix X-ray; GE Inspection Technologies69, Wunstorf, Germany
Radiographic Testing (RT), computed tomography (CT), microfocus x-ray, 3D Computed Tomography, micro-CT, microtomography, Resolution, beam hardening, nano-CT, 3D, reconstruction, reconstruction algorithm, tomography
DE
DGZfP 2007
Session: Gerätetechnik
DGZfP 2007 Materialcharakterisierung
Charon XRD - Neuartiges Röntgen-Diffraktometer mit zwei kooperierenden Robotern zur Struktur-Analyse von komplexen Bauteiloberflächen
A. Haase13, A. Schafmeister12, R. Hessert28, W. Satzger22
1GE Inspection Technologies69, Wunstorf, Germany
2MTU Aero Engines GmbH53, Munich, Germany
DE
DGZfP 2007
Session: Materialcharakterisierung
DGZfP 2007 Rohrprüfung
Neues Gesamtkonzept für die Röntgenprüfung von Längsnähten an Großrohren
H. Matzen2, J. Kraemer
GE Inspection Technologies69, Wunstorf, Germany
DE
DGZfP 2007
Session: Rohrprüfung
   
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