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Search Results: 1 in Date '2011-11'      Search  
Title / Author(s) / Keywords Publication
DIR 2011 µCT Applications
High Resolution Industrial CT Systems: Advances and Comparison with Synchrotron-Based CT
E. Neuser14, O. Brunke21, A. Suppes9
Phoenix X-ray; GE Inspection Technologies67, Wunstorf, Germany
Radiographic Testing (RT), material science, Penetrant Testing (PT), 3D Computed Tomography, nanofocus, synchrotron imaging, sub-micro-CT, Other Methods
DIR 2011
Session: µCT Applications
   
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