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"GE Inspection Technologies"
Search Results: 1 in Date '2013-05'      Search  
Title / Author(s) / Keywords Publication
NDCM 2011 Advanced Techniques
X-ray Diffraction as a Tool for Automated Residual Stress Analysis and a Non-synchrotron Based Nanofocus X-ray Computed Tomographic Technique for Materials Characterization and Metrology
J. Santillan1, R. Stabenow2, M. Klatt2, A. Haase23, O. Brunke223
1GE Phoenix X-ray, San Carlos, CA, USA
2Phoenix X-ray; GE Inspection Technologies69, Wunstorf, Germany
NDCM 2011
Session: Advanced Techniques
   
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