where expertise comes together - since 1996 -

The Largest Open Access Portal of Nondestructive Testing (NDT)

Conference Proceedings, Articles, News, Exhibition, Forum, Network and more

where expertise comes together
- since 1996 -
"GE Inspection Technologies"
Search Results: 1 in Date '2013-05-01'      Search  
Title / Author(s) / Keywords Publication
NDCM 2011 Advanced Techniques
X-ray Diffraction as a Tool for Automated Residual Stress Analysis and a Non-synchrotron Based Nanofocus X-ray Computed Tomographic Technique for Materials Characterization and Metrology
J. Santillan1, R. Stabenow2, M. Klatt2, A. Haase23, O. Brunke223
1GE Phoenix X-ray, San Carlos, CA, USA
2Phoenix X-ray; GE Inspection Technologies69, Wunstorf, Germany
NDCM 2011
Session: Advanced Techniques
Actual Cooperations
We use technical and analytics cookies to ensure that we will give you the best experience of our website - More Info
this is debug window