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Search Results: 1 in Date '2015-08-01'      Search  
Title / Author(s) / Keywords Publication
DIR 2015 Quantitative imaging and image processing
Laboratory X-ray tomography for nondestructive testing of specimens and materials at the nanoscale
C. Heinzl138, J. Kastner1120, M. Firsching221, F. Nachtrab216, N. Uhlmann231, P. Takman33, A. Holmberg43, M. Krumm523, C. Sauerwein525, D. Lichau63, P. Doux6
1Research group “X-ray computed tomography”; Upper Austrian University of Applied Sciences (FH OÖ)166, Wels, Austria
2Fraunhofer Institute for Integrated Circuits (IIS)184, Fürth, Germany
3Excillum AB3, Kista, Sweden
4KTH (Royal Institute of Technology); AlbaNova University Centre 5, Stockholm, Sweden
5RayScan Technologies GmbH13, Meersburg, Germany
6Thermo Fisher Scientific13, Merignac, France
Multi-techniques fusion, CT, multi-angle radiography, X-ray detectors and sources, Photon counting, defect detection, Feature Extraction, image processing, Industrial 3D X-ray computed tomography, NanoXCT, Non destructive testing

DIR 2015
Session: Quantitative imaging and image processing
   
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