where expertise comes together - since 1996 -

The Largest Open Access Portal of Nondestructive Testing (NDT)

Conference Proceedings, Articles, News, Exhibition, Forum, Network and more

where expertise comes together
- since 1996 -
"GE Sensing & Inspection Technologies"
Search Results: 1 in Date '2019-08-01'      Search  
Title / Author(s) / Keywords Publication
DGZfP 2019 Phased Array
Phased-Array Anwendungen mit frei modulierbaren Ultraschallsendern
T. Würschig12, W. De Odorico11, P. Fey12
GE Sensing & Inspection Technologies25, Alzenau, Germany

DGZfP 2019
Session: Phased Array
Actual Cooperations
We use technical and analytics cookies to ensure that we will give you the best experience of our website - More Info
this is debug window