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|NDT.net Issue - 2015-07 - NEWS ||NDT.net Issue: 2015-07|
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)
YXLON International and MIRTEC Announce Close Cooperation Empowering Industry 4.0 in the Electronics Production MarketYXLON International GmbH198, Hamburg, Germany
HAMBURG, GERMANY May 5, 2015 — MIRTEC, the global leader in 3D AOI Technology and YXLON International, the leading industrial X-ray and computed tomography (CT) specialist, announce a new strategic cooperation which will empower yield improvement in the electronic manufacturing industry.
YXLON International and MIRTEC are offering the ultimate yield improvement tool, called SmartLoop, which removes the barriers to real process management in the electronic manufacturing industry. By linking the MIRTEC in-line 3D AOI system with the YXLON microfocus X-ray systems starting with the FeinFocus product line and combining them with a powerful management information system, suspect parts which cannot be fully checked in-line, like BGA, QFN etc., are automatically inspected with industry leading technology including Inclined CT for checking the hidden joint interfaces. All results, data and images are displayed on a single screen, including SPI data. This allows accurate decisions to be made based on complete detail, plus by tracking trends the technician can modify acceptance limits on the 3D AOI and SPI to improve the accuracy of the inspections. All data is stored in one place giving complete traceability and allowing trends to be monitored and reports produced. The result is ultimate yield improvement, as the number of false fails and escapes can be dramatically reduced.
By combining the strengths of the market leading in-line 3D AOI inspection system with the speed and accuracy of the at-line X-ray system, which allows to see hidden joint interfaces on Bottom Terminated Components like BGA’s, CSP’s, QFN’s, etc., the manufacturing process is continuously and automatically improved. “The details that the YXLON system delivers together with the Mirtec data in one single system will for the first time allow the user to generate an intelligent, fact-based decision. That will significantly improve yields and reduce costs”, as Stefan Moll, President YXLON International, explains. “As we move towards the Internet of Things within Industry 4.0 this is a major step in data integration and process management.”
“Mirtec has been in the forefront of inspection process improvement software with our Intelli-Sys and Intelli-Track software. Many of our customers are already benefiting in the reduction in required manpower and the boost to their yields,” explains Chan Wha Pak, CEO, Mirtec Co, Ltd. “The cooperation with a world leading X-Ray partner and innovative software company was the natural next stage in offering our customers not just a way to catch mistakes, but provide them with the means to stop making them.”
Visit: YXLON International GmbH