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|NDT.net Issue - 2000-11 - Articles ||NDT.net Issue: 2000-11|
Publication: 15th World Conference on NDT - 2000 - Rome (Italy) (WCNDT 2000)
A novel Surface Eddy Current probe with Phase Information on Surface Flaw DepthHiroshi Hoshikawa5, H Karasawa2, Kiyoshi Koyama6
College of Industrial Technology; Nihon University12, Narashino, Japan
The authors have devised a new surface eddy current probe that provides phase information on surface flaw depth. The flaw signal phase hardly changes by the length and width of flaws, although the signal amplitude changes a great deal. The probe is also lift-off noise free and self-nulling. The authors believe that the probe makes eddy current testing more quantitative and reliable in flaw depth evaluation than the conventional probes.
Knowledge of the depth of surface flaws is significant because material breakdowns are usually directly connected to the depth rather than their length and width. So eddy current testing has always been required to be more quantitative and reliable in evaluating depth of surface flaws.
The signal of eddy current testing by conventional probe often changes much due to the probe lift-off from the test material. Since the large lift-off noise changes signal phase much, the signal phase can hardly be used to evaluate flaws. As a result, most eddy current testing by surface probes usually uses only the amplitude of
Keywords: Electromagnetic Testing (ET) (1345), eddy current testing probe (69), flaw sizing (116), materials characterization (653),
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