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NDT.net Issue - 2009-02 - NEWS
NDT.net Issue: 2009-02
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)

PerkinElmer Introduces New High-Speed Digital X-Ray Detectors for 24/7 NDT Applications

PerkinElmer3, Waltham, MA, USA

New Radiation-hardened Detectors Provide High-Speed Real-time Industrial Inspection; Showcasing at ASNT's Fall Conference and Quality Testing Show in Charleston, SC

Charleston, SC - November 10, 2008 - The American Society for Nondestructive Testing's Fall Conference and Quality Testing Show, Booth 433 - PerkinElmer Optoelectronics, a global technology leader in digital imaging, specialty lighting and optical detection technologies, today announced it will showcase its new high-speed, high-throughput, digital x-ray detectors at the American Society for Nondestructive Testing's (ASNT) Fall Conference and Quality Testing Show on November 10-14 at the Charleston Area Convention Center in Charleston, South Carolina. This will mark PerkinElmer's first exhibition in North America of its digital imaging technologies for a range of industrial and medical applications, including metal casting inspection and diagnostic and therapeutic medical imaging. These technologies are an integral part of the Company's ongoing commitment to supporting health and environmental infrastructures around the globe. PerkinElmer's new amorphous silicon (a-Si) digital x-ray detectors offer twice the output speed of previous designs, with output up to 30 fps, while maintaining an industry- leading 16-bit resolution and the ability to produce real-time images. The detectors are radiation-hardened and designed to withstand the demanding, high energy test environments found in 24x7 production lines, making them the ideal choice for NDT applications including metal casting inspection, composite materials inspection, PCB testing, pipeline inspection, and various types of in-line manufacturing inspections.

"PerkinElmer is excited to exhibit our new a-Si digital x-ray detectors for industrial NDT applications at this important conference," said Brian Giambattista, Ph.D., president, digital imaging for PerkinElmer. "Recent enhancements to our x-ray detectors offer our customers the opportunity to perform critical real-time inspections more efficiently and cost-effectively," added Dr. Giambattista.

At the ASNT Fall Conference and Quality Testing Show, PerkinElmer will showcase two models in its new XRD N ES Detector Series:

  • XRD 1621 N ES ("enhanced speed") - 16-inch detectors which provide up to 30 fps of real time images and are suitable for radiation energies from 20 keV to 15 MeV. They provide a pixel size of 200 ìm and an image size of 2048 x 2048 pixels.
  • XRD 0820 N ES - 8-inch detectors which provide up to 30 fps of real time images and are suitable for radiation energies from 20 keV to 450 keV. They provide a pixel size of 200 ìm and an image size of 1024 x 1024 pixels. Options include a detector available with a carbon fiber cover to provide excellent image quality at low X-ray energy levels.

    PerkinElmer has delivered more than 15,000 a-Si x-ray detectors worldwide for a range of industrial NDT as well as medical applications ranging from diagnostic radiography to radiotherapy for cancer treatment. PerkinElmer is able to support the needs of an expanding global market through its state-of-the-art manufacturing facilities located in Walluf, Germany and its newly expanded fab in Santa Clara, California, USA.

    PerkinElmer representatives will be available for comment on its new digital x-ray detectors at booth 433, in the main conference hall. For more information or to schedule an appointment, please contact Mr. Anthony Lauletta Jr., Marketing Communications Manager, at anthony.lauletta@perkinelmer.com or 978-224-4100

    PerkinElmer, Inc. is a global technology leader driving growth and innovation in Health Sciences and Photonics markets to improve the quality of life. The Company reported revenues of $1.8 billion in 2007, has approximately 9,100 employees serving customers in more than 150 countries, and is a component of the S&P 500 Index. Additional information is available through www.perkinelmer.com or 1-877-PKI-NYSE.

    For further information contact:
    Heather Nevers
    Brodeur Partners

    Francine S. Bernitz
    Director of Marketing
    PerkinElmer Optoelectronics
    978-224-4321, 781-789-3178 (mobile)

Keywords: Radiographic Testing (RT) (1532), instrumentation (454), Digital Detector Arrays (43),
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