This month issue starts to publish the session "Smart Structures and Non-Destructive Testing" of
the 3rd Int' Conf' on Experimental Mechanics at 29.11.- 1.12.2004 in Singapore.
We'll continue to publish more papers of the ICEM2004 in future issues.
The Exhibition is currently undergoing a redesign with lots more features
for exhibitors and readers. NDT companies are invited to Exhibition
Registration to create your Exhibition Stand now.
Smart Structures and Non-Destructive Testing are closely linked technologies. The development
of smart structures with embedded materials monitoring structure health is fast becoming one of the
most effective NDT techniques. Nevertheless the fundamental NDT techniques like ultrasonics,
radiography, eddy current and a host of numerous other new developing procedures like shearography,
thermography, laser and phased array ultrasonics, automation and software interpretation of signals
will always be an essential complement to smart structure technology.
B Stephen Wong
|Thanks to Brian Stephen Wong, who works on the NDT.net Editor Advisory Board and coordinated this issue.
Also we wish to thank authors and SPIE for all their co-operation.
Brian Stephen Wong, Chair of this Session